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Surface Insulation Resistance Handbook
1 SCOPE AND DESIGNATION
Surface Insulation Resistance (SIR) testing has been with the electronics industry since the advent of the transistor and the printed board. It has been used as a tool for incoming inspection, materials investigations and qualifications, quality conformance, prediction of long-term failure mechanisms and as a predictive tool for estimated service life.
SIR testing is a quantitative and not qualitative test method and should be viewed as an essential tool that requires understanding in order to use properly.
Electrochemical reactions at or below the surface of electronic circuits will affect their SIR. These reactions require the presence of humidity, electrical bias and ionic contaminants. The VENN diagram shown in Figure 1-1 illustrates how these reactions may be influenced.
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