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Supporting Data and Numerical Examples for ANSI/J-STD-001B: APPENDIX D (Control of Fluxes)
Foreword
The purpose of this white paper is to document some of the technical rationale and additional data that a potential user of the revised Appendix D might find useful. In order to try to preserve the original ‘‘flavor’’ of the comments/ discussion, this document is broken into sections coinciding with the proposed revision to Appendix D and rationale given in each section.
1 SCOPE/INTRODUCTION
1.1 Scope
During the kickoff meeting at San Diego for this task group (5/l/95), a vote was taken to determine if the attendees (some 26 members of industry) felt that a revision to the existing appendix D was needed. The group voted unanimously that a revision was required. The two major areas of complaint were: a) there were concerns regarding the lack of a ‘‘uniform’’ approach made the testing more costly and delayed implementation for both users and suppliers; and b) the test method didn’t address all assembly methods (e.g. ‘‘chip and DIP’’ and ‘‘PTH only’’). It is the intent of this revision to correct these problems.
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