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In-Process DPMO and Estimated Yield for PCAs
1 OVERVIEW
1.1 Scope
This document defines standard methodologies for calculating defects per million opportunities (DPMO) metrics related to electronic printed board assembly processes. It is intended for use in measuring in-process assembly steps rather than end product determination. Calculation of completed item DPMO is addressed in IPC- 7912.
Additionally, a guide to defect categorization is provided that when used with J-STD-001 and IPC-A-610 can serve as a base for summarizing and reporting in-process defects.
Note: This document does not dictate the number of assemblies or data points needed to calculate DPMO metrics.
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